Showing 1–12 of 118 results
-Jitter Analysis
-Eye Measurements
-Eye Mask Test
-Advanced Pattern Acquisition
-Pre-emphasis Measurement
-Automated J2/J9 measurements
-Scope with integrated CDR
-Jitter Components Decomposition
-NRZ & PAM4 Eye Mask Test
-S21 Measurements
-Clock Recovery Option
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Multilane offers CAUI-4 and 28G VSR compliance testing services for system vendors, system integrators, module vendors and switch vendors.
Since November 2015 we have been helping different transceiver vendors optimizing their products to pass the CAUI-4 specifications.
To inquire about lead time, get a quick quote and receive a sample test report, please contact us at sales@multilaneinc.com
This solution is offered to test hosts and modules for OIF_CEI_03.1 and IEEE_CAUI-4 compliance.
In the beginning, the user selects the desired standard that he wants to follow in order to test his DUT.
The solution supports output tests and stressed input tests.
Output Tests
For an output test, a DSO, a reference clock and a DUT are required.
To perform this test, the user makes the hardware connections and configures the DSO. Then, he chooses the measurements that he needs to test. The following measurements are available:
-Rise Time
-Fall Time
-Eye Width 15
-Eye Height 15
-Vertical Eye Closure
-Differential Voltage pk-pk
The user can choose to run as many acquisitions as he wants. In the end, he will get the results of the selected measurements in compliance with the standard that was chosen in the beginning.
Note that a report is generated with all the results. The user can print or save the report in the convenient format (pdf, word).
Stressed Input Tests
For a stressed input test, a BERT, a DSO, a MCB and a HCB are required.
To perform this test, the user connects to the BERT and configures it. Then, he is required to calibrate it before performing the test. He is guided though each of the calibration steps. After the calibration process , he can run the BER test during a specific amount of time that he chooses. After the test is done, he can view the results according to the chosen standard.
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Multilane's AOC Consolidated API Library allows easy communication with all the above Hardware in order to provide an efficient and automated AOC testing solution supporting the following:
-Voltage, Current and Power consumption measurements against limits
-Temperature Measurements
-Bulk EEPROM programming for QSFP modules through ML4021 MSA compliant I2C Master
-PPG output signal according to 40G Ethernet AOC electrical specs
-Eye Diagram and Jitter Measurements
-BER and J2/J9 Measurements
-Four corner testing without the need for manual user intervention
The DSO Measurement Library provides the following functions:
-Total Jitter & Jitter decomposition: DJ, RJ
-Mask Margin, Alternate Mask Margin rules available
-The mask margin (positive or negative) can be extracted for a defined number of points that fail, thus allowing for DUT quality assessment, control and binning
-The number of failed points for a region can be returned as well as the actual points that failed
-Eye opening, eye height and width, eye amplitude, top, base, max, min, and peak to peak
-Rise/ Fall Time and Single Edge measurement in pattern capture
-Crossing percentage
-Pre-emphasis positive & negative (amplitude width)
-Advanced Pattern Measurements
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The ML1016D-CR is a 53.125 GBd PAM4 Optical Clock Recovery Modules ideally suited for 100G Lambda MSA optical measurements. The recovered clock can trigger the ML4015D Optical Scope to perform 53.125 GBd PAM4 optical measurements such as TDECQ, OMA, and ER. ML1016D-CR supports a variety of standards such as 400GBASE-DR4/FR4/LR4, and 100GBASE-DR/FR/LR. In addition, the ML1016D-CR supports clock recovery of other key standards such as 100GBASE-LR4, PSM4, CWDM4, and SR4. Also standards with 26.6 GBd PAM4 signaling format are supported. Single and dual channel modules are available
Typical Applications
- Production testing of 400G transceivers
- Optical transceiver test
- Transceiver manufacturing test
- Transceiver evaluation and validation
- Incoming inspection of transceivers
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CFP2-ACO Development Kit Break-Out Module ML2028-ACO provides an efficient and easy method to test and characterize line cards with 4x32G CFP2-ACO ports.
The ML2028-ACO simply plugs into a CFP2-ACO slot and provides access to RX and TX ports through high performance signal integrity breakout path.
It includes 2 Huber Suhner MXP 1x8 coaxial PCB connectors (1x8A_81_MXP-S50-0-1/111_N) or 2 ML 40GHz multi-SMPM.
Key Features:
-High Performance signal integrity traces
-CFP2-ACO MSA Form Factor
-Low Insertion Loss Rogers 3003 based material
-LEDs showing MOD_RSTn , MOD_LOPWR and TX_DIS signals status
-Supports 4x32G TX & RX Lanes
-High speed signals accessible through 2 Huber+Suhner MXP or MSMPM Connector rows
-All TX channels come with matching trace length
-All RX channels come with matching trace length
-Trace length 4486 mil
-OSP finish
-Reference clock accessible via SMA connector
-Optional external MDIO (port address and global alarm trough pin header)
Applications:
-System Characterization
-Signal Integrity analysis
-CFP2-ACO Line Card and Port Characterization
Read more | Documentation | |
|---|---|
| API | API And Documents |
| S-parameters (HCB/MCB) | measured |
CFP2 Development Kit Break-Out Module ML2028K-ACO provides an efficient and easy method to test and characterize line cards with 4x32G CFP2 ports.
The ML2028K-ACO uses 40GHz K connectors. It simply plugs into a CFP2 slot and provides access to RX and TX ports through high performance signal integrity breakout path.
Key Features:
-High Performance signal integrity traces
-CFP2 MSA Form Factor
-Low Insertion Loss Rogers 3003 based material
-Supports 4x32G TX & RX Lanes
-High speed signals accessible through K connectors
-All TX channels come with matching trace length
-All RX channels come with matching trace length
-Trace length 5618 mil
-OSP finish
Applications:
-System Characterization
-Signal Integrity analysis
-CFP2-ACO Line Card and Port Characterization
Read more | Documentation | |
|---|---|
| API | API And Documents |
| S-parameters (HCB/MCB) | measured |
The Multilane ML4000-4 is designed as a 6U 4-slot PCI CHASSIS with PICMG 2.16 specification Backplane and Switchboard.
ML4000-4 is used for testing and validating equipments of high speed electrical/optical communication.
Key Features:
-Standard cPCI 6U Chassis
-4-Slot Backplane
-Built-in Power Supply
-Built-in Cooling Fans
-Hot-swappable Dust-proof Filter
Read more | Documentation | |
|---|---|
| Software | GUI |
| API | API And Documents |
The MultiLane ML4000-8A is designed as a 6U 8-slot PCI CHASSIS with PICMG 2.16 specification Backplane and Switchboard.
ML4000-8A is used for testing and validating equipments of high speed electrical/optical communication.
Key Features:
-Compact PCI 6U Chassis
-8-Slot Backplane
-cPCI Std. 2.0 R3.0, 2.16 R1.0
-LED indication for Power/Fan Status & Temp. Alarm
-Includes Rack Mount Kit
-Optional Switchboard
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The MultiLane ML4000-8B is designed as a cPCI 6U chassis with PICMG 2.16 specification Backplane and Switchboard.
ML4000-8B is used for testing and validating equipments of high speed electrical/optical communication.
Key Features:
-Compact PCI 6U Chassis
-8-Slot Backplane
-cPCI Std. 2.0 R3.0, 2.16 R1.0
-LED indication for Power/Fan Status & Temp. Alarm
-Includes Rack Mount Kit
-Optional Switchboard
Read more | Documentation | |
|---|---|
| Software | GUI |
| API | API And Documents |
QSFP+ Passive Loopback Module ML4002 is used for testing QSFP/QSFP+ transceiver ports under board level tests. By substituting a full-featured QSFP/ QSFP+ transceiver with the ML4002, the electrical loopback will provide a cost effective low loss method for QSFP/QSFP+ port testing.
The ML4002 is packaged in a standard MSA housing compatible with all QSFP/QSFP+ ports. Transmiting data from the host is electrically routed (internal to the loopback module) to receive data outputs and send them back to the host. It provides an economical way to exercise QSFP/QSFP+ ports during R&D validation, production testing, and field testing.
The ML4002 provides QSFP/QSFP+ power Class 1, 2, 3 or 4 (standard) using a customer supplied +3.3V voltage supply.
Key Features:
-Operation up to 14G per lane
-Supports 4x14G
-QSFP+ MSA Form Factor
-Dual LED indicators
-Custom Memory Maps
-Built in diagnostic functions
-Supports 56.4Gb/s total data rate
-Hot-pluggable MSA footprint
-Fully SFF-8436 MSA Compliant
-Temperature range from 0° to 80° C
-MSA Compliant EEPROM
Benefits:
-Economical QSFP/QSFP+ Port Testing
-Custom Memory Maps
-Board Level System Testing
-Power On Validation
-Excellent Signal Integrity
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