Hi-speed test equipment provider Multilane SAL has recently unveiled an all-new test platform under the name ML4004 Time Domain Analyzer, representing a breakthrough in time domain test and measurement applications.
The TDA incorporates the functionality of a single channel Bit Error Rate Tester. It includes a single channel digital sampling scope and an integrated CDR enclosed in a bench-top shell that could fit in the hand. An all-new GUI allows users to communicate with the BERT portion and performs eye captures and measurements simultaneously in the same window.
Featuring an intrinsic jitter level of 200 fs , the TDA platform will have the capability of exceeding the 30Gb/s per lane threshold in time for a new age of hi-speed characterization. Thanks to CDR capability, the scope can support bandwidths up to 50Ghz, while being able to perform full jitter decomposition, implement software based filters and sample an incoming signal without the need of a clock . The BERT portion is customizable to offer high voltage output or jitter generation.
Multilane is a leading supplier of 100G production test instruments and interconnect test products for the optical networking and cloud computing infrastructures.
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