April 25, 2018
FOR IMMEDIATE RELEASE
MultiLane ML4015D optical scope supports 400G transceiver testing
High-throughput optical module tester delivers premium performance at a surprisingly affordable price.
Fremont, CA High speed test equipment manufacturer MultiLane Inc. announces the release of its ML4015D optical scope with 40 GHz of bandwidth, a flexible test platform targeting 400 Gb/s Ethernet optical transceivers. Capable of handling symbol rates as high as 53.1 Gbaud, the scope supports a wide range of optical standards such as 400GBASE-DR4/FR4/LR4 and those developed by the 100G Lambda MSA. The ML4015D can be configured to test both PAM-4 and NRZ signaling formats. In addition, the instrument offers integrated clock recovery up to 56 Gbaud PAM-4 an industry first eliminating the need for complicated clocking schemes in the test setup.
Optical testing is a bottleneck in transceiver manufacturing. In developing the ML4015D, MultiLane identified key pain points and built an instrument that would address them:
- Throughput: The ML4015D can perform single channel or two- and four-channel parallel testing.
- Multiple line rates: The scope tests 53.1 Gbaud PAM-4, 26.6 Gbaud PAM-4, and 25.8 Gbaud NRZ formats
- Specialized test needs: The ML4015D characterizes both optical and electrical parameters.
- Cost: The unit features value pricing, free analysis software, and high-speed operation that significantly reduces the cost of test per transceiver.
- Limited bench space: Measuring 3.5 in. x 8.6 in. x 11.8 in., the ML4015D works as a bench-top or rack-mount unit.
We outperform the competition
Performance: better optical performance than the competition, with higher sensitivity (better than -13 dBm at 25.8 G NRZ) and lower noise (3 mW at 26.6 GHz bandwidth)
Lower cost of test: 50% lower list price than the incumbent and all the analysis software for free
Measurement throughput: 400X faster sampling rate at 100 MHz, with a TDECQ test time of less than 5 s
The ML4015D optical scope nicely complements the rest of MultiLane’s portfolio such as its interconnects, BERTs, and system margin testers. For example, MultiLane offers the ML4039D and ML4079D, which are 28 Gbaud PAM-4 BERTs with four and eight channels, respectively. These BERTs can drive and test the 200GAUI-4 and 400GAUI-8 electrical interface of the optical transceivers and host switches.
With the December 2017 ratification of the 400G Ethernet standard, manufacturing and deployment of compatible modules is ramping up. Network-equipment manufacturers and service providers alike need effective equipment to test and validate modules. MultiLane stands ready to help.
“MultiLane has the customer intimacy and agility to meet and/or exceed customer requirements,” explains Kees Propstra, senior director of product marketing at MultiLane. “With its broad portfolio of solutions, MultiLane truly enables the 400G data center revolution in a very cost effective manner.” In addition, the company plans to offer 400G compliance test services in Silicon Valley in its Fremont, California facility by this summer.
For questions about this release or to learn more about how the ML4015D can streamline your product development, transceiver manufacturing, or network infrastructure, contact us:
Media contact: Kees Propstra @ +1-510-738-9484 or firstname.lastname@example.org
Sales contact: email@example.com
MultiLane Inc. develops instruments and interconnect test modules for 10, 40, 100, and 400 Gb/s data rates. Products include BERTs, optical scopes, and a host of MSA-compliant development tools for CFP, CFP2, QSFP, QSFP-DD, and OSFP modules. The company also offers professional engineering services and turnkey solutions of modules and systems for high speed I/O, and signal integrity. MultiLane’s products are used to test semiconductors, AOC, electro-optical modules, and blades.
Hi-speed test equipment provider Multilane SAL has recently unveiled an all-new test platform under the name ML4004 Time Domain Analyzer, representing a breakthrough in time domain test and measurement applications.
The TDA incorporates the functionality of a single channel Bit Error Rate Tester. It includes a single channel digital sampling scope and an integrated CDR enclosed in a bench-top shell that could fit in the hand. An all-new GUI allows users to communicate with the BERT portion and performs eye captures and measurements simultaneously in the same window.
Featuring an intrinsic jitter level of 200 fs , the TDA platform will have the capability of exceeding the 30Gb/s per lane threshold in time for a new age of hi-speed characterization. Thanks to CDR capability, the scope can support bandwidths up to 50Ghz, while being able to perform full jitter decomposition, implement software based filters and sample an incoming signal without the need of a clock . The BERT portion is customizable to offer high voltage output or jitter generation.
Multilane is a leading supplier of 100G production test instruments and interconnect test products for the optical networking and cloud computing infrastructures.
•MultiLane sal Contacts:
(M) +961 5 94 16 68
(M) +1 408 890 2234