On October 1st2019, a memorandum of understanding was signed between the faculty of engineering at Notre Dame University – Louaize and Houmal Technology Park. The fruitful outcome of Fadi Daou’s visit reflected the mutual priority for both parties: Bringing academia and industry together by providing students with high-value opportunities. As a result of this new collaboration, all NDU students can now train at HTP for free and be integrated in significant technological research alongside top-tier professionals. They will also have the chance to take part in HTP’s Coop program that offers various benefits such as paid internships.
The MOU’s goal is to shape these young bright minds into becoming future leaders in Lebanon.
Please read article here.
MultiLane as part of the European Photonics Industry Consortium Summit
August 29-30th2019 MultiLane was a part of the EPIC world photonics technology summit, which took place in Berlin. CEO and Founder of MultiLane, Fadi Daou, gave an informative presentation on the company in which he discussed critical topics such as products and solutions, worldwide customers, significant partnerships for offering high-speed IO testing, challenges, and important comparisons with our main competitors. Most significantly, he introduced our latest solution, which will be presented at ECOC Dublin, and how it might reshape the reality of system integration and testing.
Find the full presentation here
PAM4 BERT Common Features:
- PRBS 7-31, and user pattern up to 16k bits
- Programmable Signal Shaping, Pre and Post Emphasis
- Programmable amplitude and inner eye
- SNR Measurements at center of eye
- J2/J9 measurements in NRZ
- Supports FEC KR4 or scaled KP4 for line-side
- Data Rates 18.6 to 30GBaud
- Error Detector Phase Margin: 5 ps
- Low intrinsic Jitter ~220fs
- OIF CEI-56G-PAM-xxx compliant DSO library Jitter Injection for CEI-56G VSR PAM
CEI-56G-VSR-PAM4 SJ Profile
Clean PAM Pattern
PAM4 Eye of the ML4039-PAM-ATE with RJ applied
PAM Pattern of an ML4004-PAM with 26ps SJ Applied
QSFP-DD Passive Loopback Module ML4062 is used for testing QSFP-DD transceiver ports under board level tests. By substituting a full-featured QSFP-DD transceiver with the ML4062, the electrical loopback will provide a cost effective low loss method for QSFP-DD port testing.
The ML4062 is packaged in a standard MSA housing that is compatible with all QSFP-DD ports. Transmitting data from the host is electrically routed (internal to the loopback module) to receive data outputs and send them back to the host. It provides an economical way to exercise QSFP-DD ports during R&D validation, production testing, and field testing.The ML4062 provides 9 power classes using a customer supplied +3.3V voltage supply .
ML4057 provides an easy and effective solution for programming and characterization of CFP8 modules. It includes a complete user friendly GUI supporting all features defined by CFP8 MSA . The latter simplifies the configuration process. Current sense circuit is also included on the Host for checking modules’ power class.
ML4058 breakout module can be used to test and to characterize line cards with 16x25G CFP8 host interfaces.
ML4059 is used for Testing CFP8 ports working at 16x25Gbps. It is packaged in MSA compliant housing offering excellent heat dissipation. The module can be programmed to different power levels through MDIO interface; thus, emulating all CFP8 power classes.
ML4046 is used for testing uQSFP transceiver ports under board level tests. Substituting a full-featured uQSFP transceiver with the ML4046 provides a cost effective low loss method for uQSFP port testing via electrical loopback. It can emulate power classes from 1 to 7 using a +3.3V voltage supply.
ML4044 is designed to provide an efficient and easy method for programming and testing 100G uQSFP transceivers and active optical cables. It includes a complete user-friendly GUI supporting all features defined by uQSFP MSA. This simplifies configuration processes to enable intuitive memory map programming and testing..
ML4045 Breakout module can be used for testing and characterizing 4x28G line cards and host interfaces.